DocumentCode :
416596
Title :
Crystallization measurement using quartz crystal analyzer
Author :
Kim, Byung Chul ; Kim, Young Han
Author_Institution :
Dong-A University
Volume :
1
fYear :
2003
fDate :
4-6 Aug. 2003
Firstpage :
793
Lastpage :
796
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SICE 2003 Annual Conference
Conference_Location :
Fukui, Japan
Print_ISBN :
0-7803-8352-4
Type :
conf
Filename :
1323480
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=416596
