DocumentCode
416804
Title
Evaluation of sealed type cell of indium point in NMIJ
Author
Tamba, J. ; Koizumi, K. ; Sakai, M. ; Sato, K. ; Kishimoto, I. ; Arai, M.
Author_Institution
Nat. Metrology Inst. of Japan, National Inst. of Adv. Industrial Sci. & Technol., Ibaraki, Japan
Volume
3
fYear
2003
fDate
4-6 Aug. 2003
Firstpage
3039
Abstract
The freezing point of indium is one of the temperature fixed points defined in the ITS-90. An open type cell of indium is used as the national standard and a sealed type cell as a working standard in NMIJ. The realized temperatures of those cells have been compared with each other almost yearly since 1997. The temperature difference and the comparison uncertainty were investigated. The freezing temperature of the sealed type cell is 1.27 mK higher than that of the open type cell with the comparison uncertainty of 0.19 mK in 2003. The change of the temperature difference during the past six years is still tolerable.
Keywords
calibration; freezing; indium; temperature measurement; temperature scales; 0.19 mK; 1.27 mK; National Metrology Institute of Japan; freezing temperature; indium point; national standard; sealed type cell;
fLanguage
English
Publisher
ieee
Conference_Titel
SICE 2003 Annual Conference
Conference_Location
Fukui, Japan
Print_ISBN
0-7803-8352-4
Type
conf
Filename
1323869
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