Title :
2015 Special Issue of IEEE Transactions on Nuclear Science Modeling and Simulation of Radiation Effects Editor Comments
Author :
Fleetwood, Dan ; Brown, Dennis ; Girard, Sylvain ; Gouker, Pascale ; Gerardin, Simone ; Quinn, Heather ; Barnaby, Hugh
Author_Institution :
Vanderbilt University,
Abstract :
The papers in this special issue review and/or extend the state of the art in modeling and simulation of radiation effects on microelectronics. Papers in the issue cover a broad range of topics, including single event effects, total ionizing dose effects, displacement damage effects, defects in microelectronic devices, and electromagnetic pulse effects.
Keywords :
Analytical models; Microelectronics; Nuclear power generation; Object recognition; Predictive models; Radiation effects; Special issues and sections;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2015.2462231
