• DocumentCode
    41806
  • Title

    Ultracapacitor Degradation State Diagnosis via Electrochemical Impedance Spectroscopy

  • Author

    Marracci, Mirko ; Tellini, Bernardo ; Catelani, Marcantonio ; Ciani, Lorenzo

  • Author_Institution
    Dept. of Energy, Syst., Land & Constructions Eng., Univ. of Pisa, Pisa, Italy
  • Volume
    64
  • Issue
    7
  • fYear
    2015
  • fDate
    Jul-15
  • Firstpage
    1916
  • Lastpage
    1921
  • Abstract
    In this paper, we propose the use of the electrochemical impedance spectroscopy technique for state diagnosis of electric double-layer ultracapacitors. Ultracapacitors under investigation are Maxwell BCAP 0350 and they were stressed in several ways for our study. The analyzed stress conditions include accelerated aging tests, overvoltage, and over temperature tests. Chemical and physical effects on supercapacitor materials are pointed out through a morphologic analysis implemented by means of an environmental scanning electron microscope and a chemical composition analysis obtained by means of an energy dispersive spectrometer. Consequent degradation effects are described in terms of frequency behavior of equivalent circuital parameters.
  • Keywords
    ageing; electrochemical impedance spectroscopy; overvoltage; scanning electron microscopy; spectrometers; supercapacitors; Maxwell BCAP 0350; accelerated aging test; chemical composition analysis; chemical effects; electric double layer ultracapacitors; electrochemical impedance spectroscopy; energy dispersive spectrometer; environmental scanning electron microscope; equivalent circuital parameters; morphologic analysis; over temperature test; overvoltage test; physical effects; supercapacitor materials; ultracapacitor degradation state diagnosis; Aging; Capacitance; Degradation; Electrodes; Supercapacitors; Voltage control; Accelerated aging; electrochemical impedance spectroscopy (EIS); measurement; ultracapacitors; ultracapacitors.;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2014.2367772
  • Filename
    6955854