Efficient analysis of multilayered broadside edge-coupled anisotropic structures for microwave applications

A variational method coupled to spectral domain technique is used for the analysis of multilayered anisotropic microwave structures for various applications including MICs and electro-optic modulators. The most useful parameters of a variety of planar transmission lines in isolated and coupled configurations, with anisotropic substrates having aligned or tilted optical axis, are computed. Using the variational method in conjunction with the transverse transmission-line technique, the analysis reduces to the determination of a single admittance parameter. This parameter can be obtained from the transmission-line equivalent circuit of the structure almost by inspection.