• DocumentCode
    418408
  • Title

    Electrical connectivity analysis of a MEMS micropackage

  • Author

    Chowdhury, Sazzadur ; Ahmadi, M. ; Miller, W.C.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Windsor Univ., Ont., Canada
  • Volume
    4
  • fYear
    2004
  • fDate
    23-26 May 2004
  • Abstract
    A 3-D modular micropackage has been designed using MEMS technology that can provide electrical connectivity among dies or devices of diverse technological origin, while providing excellent mechanical protection and thermal management. The MEMS modules can be vertically integrated using a microbus card and channel concept to provide the necessary electronic connectivity. This significantly reduces interconnection lengths and the related transmission line effects. In this paper an analysis of the electrical connectivity of the proposed microbus card and channel system is presented. A lumped parameter frequency variant model of the interconnection path has been derived. Both time and frequency domain analysis has been carried out to obtain pulse propagation properties and frequency response results. The analysis shows that excellent high-speed interconnectivity at frequencies up to 10 GHz can be achieved with the proposed microbus card and channel interconnection system.
  • Keywords
    chip scale packaging; integrated circuit modelling; interconnections; microsensors; microstrip lines; modules; time-frequency analysis; 3-D modular micropackage; MEMS micropackage; MEMS modules; MEMS technology; channel interconnection system; electrical connectivity analysis; electronic connectivity; frequency domain analysis; high-speed interconnectivity; interconnection length; lumped parameter frequency variant model; mechanical protection; microbus card; pulse propagation; thermal management; time domain analysis; transmission line effects; Conducting materials; Electronic packaging thermal management; Frequency domain analysis; Integrated circuit interconnections; Micromechanical devices; Sensor arrays; Silicon; Thermal conductivity; Thermal expansion; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2004. ISCAS '04. Proceedings of the 2004 International Symposium on
  • Print_ISBN
    0-7803-8251-X
  • Type

    conf

  • DOI
    10.1109/ISCAS.2004.1329154
  • Filename
    1329154