DocumentCode :
418498
Title :
An experimental comparison of substrate noise generated by CMOS and by low-noise digital circuits
Author :
Albuquerque, Edgar F M ; Silva, Manuel M.
Author_Institution :
INESC-ID, Lisbon, Portugal
Volume :
2
fYear :
2004
fDate :
23-26 May 2004
Abstract :
Two logic families, CSL (Current-Steering Logic) and CBL (Current-Balanced Logic), that have been proposed to reduce the substrate noise in mixed-signal integrated circuits, are compared with conventional CMOS by measurements on a test chip. Large CBL cells with wire bonding have a reduction of the substrate noise effect, with respect to CMOS, by a factor of 2.5, whereas CSL is noisier than CMOS. This agrees with the simulations. The moderate noise improvement shown in the simulations by CBL circuits with complementary outputs is not confirmed experimentally. The results here show that previous evaluations based on the amplitude of the supply current spikes are unsuitable to assess the real noise performance.
Keywords :
CMOS integrated circuits; MOSFET; integrated circuit noise; lead bonding; mixed analogue-digital integrated circuits; noise generators; system-on-chip; CMOS logic circuit; amplitude; current spikes; current-balanced logic circuit; current-steering logic circuit; low noise digital circuits; mixed-signal integrated circuits; real noise performance; substrate noise effects; test chip; wire bonding; CMOS digital integrated circuits; CMOS logic circuits; Circuit noise; Circuit simulation; Circuit testing; Digital circuits; Integrated circuit noise; Logic testing; Noise generators; Noise reduction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2004. ISCAS '04. Proceedings of the 2004 International Symposium on
Print_ISBN :
0-7803-8251-X
Type :
conf
DOI :
10.1109/ISCAS.2004.1329313
Filename :
1329313
Link To Document :
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