Title :
An improved technique to increase noise-tolerance in dynamic digital circuits
Author :
Mendoza-Hernandez, F. ; Linares, M. ; Champac, V.H.
Author_Institution :
Dept. of Phys. Investigation, Sonora Univ., Mexico
Abstract :
Due to the rapid scaling of the transistor and interconnect dimensions the VLSI circuit technology is having an impressive advancement. However, noise issues emerge as an important cost in deep submicron circuits. In this paper we propose an improved noise-tolerant dynamic digital circuit technique. By using a charge redistribution process together with the conventional precharge of internal nodes in logic gates, the noise immunity is increased. Simulation results show an improvement of up to 8.6×over conventional dynamic logic.
Keywords :
CMOS integrated circuits; VLSI; digital circuits; integrated circuit noise; logic gates; CMOS circuit; VLSI circuit technology; charge redistribution process; charge transfer technique; complementary metal oxide semiconductor; deep submicron circuits; dynamic digital circuits; logic gates; noise tolerant technique; very large scale integration; CMOS logic circuits; Circuit noise; Circuit simulation; Crosstalk; Digital circuits; Integrated circuit interconnections; Logic gates; Transistors; Very large scale integration; Wires;
Conference_Titel :
Circuits and Systems, 2004. ISCAS '04. Proceedings of the 2004 International Symposium on
Print_ISBN :
0-7803-8251-X
DOI :
10.1109/ISCAS.2004.1329315
