DocumentCode
418514
Title
A technique to deskew differential PCB traces
Author
Atrash, Amer Hani ; Butka, Brian
Author_Institution
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Volume
2
fYear
2004
fDate
23-26 May 2004
Abstract
A technique for deskewing a pair of terminated, differential PCB traces has been developed and fabricated in 0.25 μm CMOS technology. The deskewing system utilizes a delay-locked-loop with a digital counter-controlled delay line to match the delay through the positive and negative traces. Time domain reflectometry is used to measure the delay from the terminating resistor to the transmitting chip. The core circuitry occupies 588 μm×235 μm. Simulation results indicate that skews of over 1 ns can be eliminated using this technique.
Keywords
CMOS digital integrated circuits; counting circuits; delay lines; delay lock loops; integrated circuit design; printed circuits; 0.25 micron; 1 ns; CMOS technology; core circuitry; delay locked loop; deskew differential PCB traces; digital counter controlled delay line; negative traces; positive traces; time domain reflectometry; Added delay; CMOS technology; Counting circuits; Data communication; Delay effects; Delay lines; Distortion; Microstrip; Reflectometry; Resistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2004. ISCAS '04. Proceedings of the 2004 International Symposium on
Print_ISBN
0-7803-8251-X
Type
conf
DOI
10.1109/ISCAS.2004.1329334
Filename
1329334
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