• DocumentCode
    418514
  • Title

    A technique to deskew differential PCB traces

  • Author

    Atrash, Amer Hani ; Butka, Brian

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    2
  • fYear
    2004
  • fDate
    23-26 May 2004
  • Abstract
    A technique for deskewing a pair of terminated, differential PCB traces has been developed and fabricated in 0.25 μm CMOS technology. The deskewing system utilizes a delay-locked-loop with a digital counter-controlled delay line to match the delay through the positive and negative traces. Time domain reflectometry is used to measure the delay from the terminating resistor to the transmitting chip. The core circuitry occupies 588 μm×235 μm. Simulation results indicate that skews of over 1 ns can be eliminated using this technique.
  • Keywords
    CMOS digital integrated circuits; counting circuits; delay lines; delay lock loops; integrated circuit design; printed circuits; 0.25 micron; 1 ns; CMOS technology; core circuitry; delay locked loop; deskew differential PCB traces; digital counter controlled delay line; negative traces; positive traces; time domain reflectometry; Added delay; CMOS technology; Counting circuits; Data communication; Delay effects; Delay lines; Distortion; Microstrip; Reflectometry; Resistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2004. ISCAS '04. Proceedings of the 2004 International Symposium on
  • Print_ISBN
    0-7803-8251-X
  • Type

    conf

  • DOI
    10.1109/ISCAS.2004.1329334
  • Filename
    1329334