Title :
RLC effects on worst-case switching pattern for on-chip buses
Author :
Tu, Shang-Wei ; Jou, Jing-Yang ; Chang, Yao-Wen
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Abstract :
Inductance effects on on-chip interconnects have become more and more significant in today´s high-speed digital circuits, especially on global interconnects such as signal buses. However, most existing works consider only RC effects, e.g., the worst-case switching pattern resulting from coupling capacitance, to develop their encoding schemes to reduce bus delay. In this paper, we show that the worst-case switching patterns that incur the largest bus delay are completely different while considering RC and RLC effects. The finding implies that existing encoding schemes based on RC model might not improve or even worsen the bus delay when inductance effects become dominant.
Keywords :
RC circuits; RLC circuits; capacitance; delays; encoding; high-speed integrated circuits; inductance; integrated circuit design; integrated circuit interconnections; integrated circuit modelling; RC effects; RC model; RLC effects; coupling capacitance; encoding schemes; high-speed digital circuits; inductance effect; on-chip buses; on-chip interconnects; signal bus delay; worst case switching pattern; Capacitance; Coupling circuits; Delay effects; Encoding; Inductance; Integrated circuit interconnections; RLC circuits; Switches; Switching circuits; Wires;
Conference_Titel :
Circuits and Systems, 2004. ISCAS '04. Proceedings of the 2004 International Symposium on
Print_ISBN :
0-7803-8251-X
DOI :
10.1109/ISCAS.2004.1329429