New Techniques for SET Sensitivity and Propagation Measurement in Flash-Based FPGAs

Author

Evans, Adrian ; Alexandrescu, Dan ; Ferlet-Cavrois, Veronique ; Nicolaidis, Michael

Author_Institution

IROC Technol., Grenoble, France

Volume

61

Issue

6

fYear

2014

fDate

Dec. 2014

Firstpage

3171

Lastpage

3177

Abstract

Single-event transients (SETs) remain a concern in field-programmable gate arrays (FPGAs) used for space applications. However, accurate measurement of SETs in FPGAs is challenging. This paper describes a calibrated circuit for on-chip measurement of SETs with a temporal precision better than one gate delay. In addition, a technique to measure the final effect of SETs in clocked, complex circuits is presented. Heavy-ion test results for a ProASIC3L FPGA are reported, highlighting a strong dependence between the VersaTile configuration and input signal state with the SET sensitivity and pulse propagation.

Keywords

clocks; field programmable gate arrays; radiation hardening (electronics); ProASIC3L FPGA; SET sensitivity; VersaTile configuration; calibrated circuit; clock; complex circuits; field programmable gate arrays; flash-based FPGA; heavy ion test; on-chip measurement; propagation measurement; pulse propagation; single event transients; space applications; temporal precision; Field programmable gate arrays; Latches; Logic circuits; Sensitivity; Single event transients; Transient analysis; Heavy ion and pulse laser irradiation; SET propagation; propagation-induced pulse broadening; single-event transients (SETs);

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2014.2365410

Filename

6955860