• DocumentCode
    419231
  • Title

    Novel technique for deembedding S-parameters in electromagnetic modeling of arbitrary circuits

  • Author

    Kolundzija, Branko ; Janic, Bojan ; Rakic, Milica

  • Author_Institution
    Dept. of Electr. Eng., Belgrade Univ., Serbia
  • Volume
    3
  • fYear
    2004
  • fDate
    20-25 June 2004
  • Firstpage
    2784
  • Abstract
    Different numerical methods (MoM, FEM, TLM, FDTD) are successfully used for the analysis of reciprocal microwave circuits. As a result, one usually obtains the current distribution or the near field distribution and postprocessing of these data is performed in order to evaluate the circuit parameters. However, such deembedding techniques have two shortcomings: 1) their accuracy depends on local quantities, the accuracy of which is not as good as the accuracy of global quantities; 2) there is a problem of making the proper choice of local data that should be postprocessed. The paper presents a new deembedding technique for circuits whose ports are in the form of single propagating mode transmission lines. The new technique actually simulates real measurements, using S-parameter data, which are global quantities, for postprocessing.
  • Keywords
    S-parameters; computational electromagnetics; current distribution; distributed parameter networks; microwave circuits; network analysis; numerical analysis; transmission line theory; transmission lines; FDTD; FEM; MoM; S-parameter deembedding; TLM; arbitrary circuits; circuit parameters; current distribution; electromagnetic modeling; near field distribution; numerical methods; reciprocal microwave circuit analysis; single propagating mode transmission lines; Circuit simulation; Current distribution; Distributed parameter circuits; Electromagnetic modeling; Finite difference methods; Microwave circuits; Microwave theory and techniques; Performance evaluation; Scattering parameters; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2004. IEEE
  • Print_ISBN
    0-7803-8302-8
  • Type

    conf

  • DOI
    10.1109/APS.2004.1331953
  • Filename
    1331953