DocumentCode
420434
Title
A metric for assessing the degree of device nonlinearity and improving experimental design
Author
Schreurs, Dominique ; Remley, Kate A. ; Williams, Dylan F.
Author_Institution
Div. ESAT, Katholieke Univ., Leuven, Belgium
Volume
2
fYear
2004
fDate
6-11 June 2004
Firstpage
795
Abstract
We propose a metric that quantifies the degree of nonlinearity of state-space trajectories for the purpose of improving the selection of collections of measurement data in the development of behavioral models. We illustrate the method with an off-the-shelf amplifier. We demonstrate the new sampling scheme with a measurement based model, and demonstrate that it quantitatively improves model accuracy.
Keywords
microwave amplifiers; state-space methods; transmission line theory; RMS metric; amplifier; behavioral models; device nonlinearity; measurement data collections; state-space trajectories; Design for experiments; Inspection; NIST; Noise measurement; Nonlinear distortion; Radio frequency; Radiofrequency amplifiers; Sampling methods; Transmission lines; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 2004 IEEE MTT-S International
ISSN
0149-645X
Print_ISBN
0-7803-8331-1
Type
conf
DOI
10.1109/MWSYM.2004.1339083
Filename
1339083
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