Title :
Compact dictionaries for diagnosis of unmodeled faults in scan-BIST
Author :
Liu, Chunsheng ; Dwarakanath, Kumar N. ; Chakrabarty, Krishnendu ; Blanton, Ronald D Shawn
Author_Institution :
Dept. of Comput. & Electron. Eng., Nebraska Univ., Omaha, NE, USA
Abstract :
We address the problem of generating compact dictionaries for the diagnosis of unmodeled faults in scan-BIST. We present dictionary organization schemes that provide two orders of magnitude reduction in dictionary size with no significant loss in resolution, and facilitate the diagnosis of unmodeled faults. Experimental results for the ISCAS-89 benchmark circuits show that various types of unmodeled faults can be efficiently located using compact dictionaries generated for single stuck-at-faults.
Keywords :
benchmark testing; boundary scan testing; built-in self test; fault simulation; logic testing; ISCAS-89 benchmark circuits; compact dictionaries; dictionary organization schemes; dictionary size; order of magnitude reduction; scan-BIST; single stuck-at-faults; unmodeled faults diagnosis; Automatic test pattern generation; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Compaction; Dictionaries; Electrical fault detection; Fault detection; Fault diagnosis;
Conference_Titel :
VLSI, 2004. Proceedings. IEEE Computer society Annual Symposium on
Print_ISBN :
0-7695-2097-9
DOI :
10.1109/ISVLSI.2004.1339526
