Title :
Experimental Assessment of Cache Memory Soft Error Rate Prediction Technique
Author :
Houssany, Sabrine ; Guibbaud, Nicolas ; Bougerol, Antonin ; Leveugle, R. ; Santini, Thomas ; Miller, Florent
Author_Institution :
Innovation Works, EADS France the Eur. Aeronaut. Defense & Space Co., Suresnes, France
Abstract :
In this paper, we explain the validation of the Cache Analyzer prediction technique thanks to accelerated test experiments. The technique, described in one of our previous works and targeted towards end-user exploitation, focuses on the analysis of cache memory transactions. This paper presents the experimental setup, including the fault detection system used to detect errors in cache memories during the physical validation experiments, and to link them with application failures. We verified that our prediction tool would have correctly predicted the failures. Results obtained during neutron and proton irradiation tests are in accordance with the Cache Analyzer predictions.
Keywords :
cache storage; failure analysis; fault diagnosis; integrated circuit testing; life testing; neutron effects; proton effects; radiation hardening (electronics); accelerated test experiments; application failure prediction; cache analyzer prediction technique; cache memory soft error rate prediction technique; cache memory transaction analysis; error detection; fault detection system; neutron irradiation tests; proton irradiation tests; Cache memory; Fault detection; Field programmable gate arrays; Life estimation; Monitoring; Neutrons; Sensitivity; Cache analyzer; cache memories; microprocessors; soft error rate;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2013.2252626