Title :
Power network analysis for ESD robustness in a 90nm ASIC design system
Author :
Brennan, C.J. ; Kozhaya, J.N. ; Proctor, R.A.
Author_Institution :
IBM Microelectron. Div., Essex Junction, VT, USA
Abstract :
ALSIM-ESD is a design automation tool to analyze power networks for good ESD performance in a high-volume, highly automated ASIC design system. The tool calculates the voltage drop produced in the power network by an ESD discharge and checks that it remains below circuit failure voltages. Automatic fix-up operations are provided to correct excessive resistance in the ESD discharge path.
Keywords :
application specific integrated circuits; circuit CAD; circuit layout CAD; electrostatic discharge; integrated circuit design; integrated circuit modelling; semiconductor device breakdown; 90 nm; ALSIM-ESD design automation tool; ESD discharge circuit failure voltages; ESD protection; ESD robustness; automated ASIC design system; drain-source breakdown; excessive ESD discharge path resistance; gate oxide breakdown; high-volume design system; power network analysis; power network voltage drops; Application specific integrated circuits; CMOS technology; Design automation; Electrostatic discharge; Immune system; Integrated circuit technology; Intelligent networks; Protection; Robustness; Voltage;
Conference_Titel :
Custom Integrated Circuits Conference, 2004. Proceedings of the IEEE 2004
Print_ISBN :
0-7803-8495-4
DOI :
10.1109/CICC.2004.1358789
