Title :
Complete characterization of various noise components in Raman amplifier using optical time domain reflectometry
Author :
Park, Jonghan ; Kim, Na Young ; Choi, Wonsub ; Lee, Hansuek ; Park, Jaehyoung ; Park, Namkyoo
Author_Institution :
Sch. of Electr. Eng., Seoul Nat. Univ., South Korea
Abstract :
We demonstrate a precise measurement of Rayleigh coefficient and its application for the complete experimental characterization of different noise components in the Raman amplifier under single experimental set-up, utilizing higher order Rayleigh scattering / signal trace measurement from the modified, high dynamic range OTDR.
Keywords :
Raman lasers; Rayleigh scattering; optical communication equipment; optical fibre amplifiers; optical noise; optical time-domain reflectometry; OTDR; Raman amplifier; Rayleigh coefficient; noise components; optical time domain reflectometry; signal trace measurement;
Conference_Titel :
Optical Fiber Communication Conference, 2004. OFC 2004
Conference_Location :
Los Angeles, CA, USA
Print_ISBN :
1-55752-772-5
