DocumentCode
421323
Title
Wavelength scale modelling of absorbing and amplifying reflective microresonator by the method of single expression
Author
Baghdasaryan, Hovik V. ; Knyazyan, Tamara M. ; Mankulov, Albert A.
Author_Institution
Fiber Opt. Commun. Lab., State Eng. Univ. of Armenia, Yerevan, Armenia
Volume
1
fYear
2004
fDate
4-8 July 2004
Firstpage
363
Abstract
To model a reflective microresonator, the advanced method of single expression (MSE) is used. Multilayer structures consisting of an absorbing (amplifying) layer located at some distance from a highly reflective metallic mirror are considered. For the metallic mirror, an optimal thickness providing high reflectivity and low loss in accordance with the Hagen-Rubens relation is suggested. For absorbing and amplifying microresonators, the corresponding reflection spectra, distributions of the electric field amplitude and power flow density across the structures are obtained. Resonant configurations for absorbing and amplifying reflective structures are defined.
Keywords
amplification; cavity resonators; electrodynamics; light absorption; microcavities; mirrors; optical multilayers; Hagen-Rubens relation; absorbing layer; absorbing microresonators; absorbing reflective microresonator; amplifying layer; amplifying microresonators; amplifying reflective microresonator; electric field amplitude; electrodynamic models; metallic mirror; method of single expression; multilayer structures; power flow density; reflection spectra; resonant absorber; resonant light emitter; resonant-cavity light-emitting diodes; resonant-cavity-enhanced photodetectors; wavelength scale modelling; Absorption; Energy loss; Light emitting diodes; Load flow; Microcavities; Mirrors; Optical reflection; Reflectivity; Resonance; Silver;
fLanguage
English
Publisher
ieee
Conference_Titel
Transparent Optical Networks, 2004. Proceedings of 2004 6th International Conference on
Print_ISBN
0-7803-8343-5
Type
conf
DOI
10.1109/ICTON.2004.1360314
Filename
1360314
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