• DocumentCode
    421325
  • Title

    Usability comparison of scalar and vectorial optical approaches to simulation of a 1.3 μm InGaAsN VCSEL operation

  • Author

    Czyszanowski, Tomasz ; Dems, Maciej ; Nakwaski, Wlodzimierz

  • Author_Institution
    Inst. of Phys., Tech. Univ. Lodz, Poland
  • Volume
    1
  • fYear
    2004
  • fDate
    4-8 July 2004
  • Firstpage
    375
  • Abstract
    Comparison of the scalar effective frequency method (EFM) and vectorial method of lines (MoL) for a 1.3 μm (GaIn)(NAs)/GaAs vertical-cavity surface-emitting laser (VCSEL) has been performed. The fundamental modes yielded by both methods exhibit the satisfactory accuracy. Higher order modes suffer from the diffraction losses and reveal non-plane wave shape. Both effects are not included in the scalar approach which can lead to the discrepancy in their results. The simulated structure has been optimised. We have found the optimal oxidation thickness equal to 0.3 μm and useful shift of oxidation layer from the antinode position ensuring mode discrimination.
  • Keywords
    gallium compounds; light diffraction; method of lines; oxidation; simulation; surface emitting lasers; vectors; 0.3 micron; 1.3 micron; EFM; GaIn-NAs-GaAs; MoL; VCSEL; antinode position; diffraction losses; higher order modes; mode discrimination; oxidation layer; scalar effective frequency method; simulation; usability; vectorial method of lines; vertical-cavity surface-emitting laser; Diffraction; Frequency; Gallium arsenide; Laser modes; Optical surface waves; Oxidation; Shape; Surface emitting lasers; Usability; Vertical cavity surface emitting lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Transparent Optical Networks, 2004. Proceedings of 2004 6th International Conference on
  • Print_ISBN
    0-7803-8343-5
  • Type

    conf

  • DOI
    10.1109/ICTON.2004.1360317
  • Filename
    1360317