• DocumentCode
    421403
  • Title

    Non-Manhattan maze routing

  • Author

    Stan, Mircea R. ; Hamzaoglu, Fatih ; Garrett, David

  • Author_Institution
    ECE Dept., Virginia Univ., Charlottesville, VA, USA
  • fYear
    2004
  • fDate
    7-11 Sept. 2004
  • Firstpage
    260
  • Lastpage
    265
  • Abstract
    The availability of multiple metal layers in modern IC processes raises the possibility of using non-Manhattan routing on some of the layers in order to reduce the average interconnect length, and thus improve performance and routability. In this paper, we present novel algorithms for both Manhattan and non-Manhattan multi-layer maze routing. The algorithms in principle can be extended to an arbitrary number of layers, but the paper focuses on four-layer routing, two in horizontal and two in vertical directions for Manhattan, and one layer each in horizontal, vertical, 45-degree and 135-degree directions for non-Manhattan routing. The non-Manhattan algorithms show an improvement of up to 12.2% in average wire length compared to Manhattan routing for two general MCNC benchmarks.
  • Keywords
    graph theory; integrated circuits; network routing; IC processes; Manhattan multilayer maze routing; arbitrary number; average interconnect length; four layer routing; graph theory; multiple metal layers; nonManhattan algorithms; nonManhattan multilayer maze routing; performance improvement; routability improvement; Algorithm design and analysis; Availability; Computational geometry; Delay; Euclidean distance; Integrated circuit interconnections; Integrated circuit layout; Permission; Routing; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Circuits and Systems Design, 2004. SBCCI 2004. 17th Symposium on
  • Print_ISBN
    1-58113-947-0
  • Type

    conf

  • DOI
    10.1109/SBCCI.2004.240979
  • Filename
    1360580