Title :
Phase-sensitive electric-field-induced second-harmonic microscopic probe of electronic materials
Author :
Wu, K. ; Carriles, R. ; Downer, M.C.
Author_Institution :
Dept. of Phys., Texas Univ., Austin, TX, USA
Abstract :
We demonstrate an electric-field-induced second-harmonic microscope that measures both amplitude and phase of imaged second-harmonic light with sub-micron spatial resolution, thus providing complete characterization of dc field variations near metal-semiconductor junctions.
Keywords :
electric field effects; image resolution; optical harmonic generation; optical microscopes; semiconductor-metal boundaries; dc field variations; electric-field-induced second harmonic generation; electric-field-induced second harmonic microscope; electronic materials; metal-semiconductor junctions; microscopic imaging; phase-sensitive microscope probe; second-harmonic light; second-harmonic microscopic probe; sub-micron spatial resolution;
Conference_Titel :
Lasers and Electro-Optics, 2004. (CLEO). Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
1-55752-777-6
