DocumentCode
421464
Title
A simple post-processing technique to improve the retrieval accuracy of second-order nonlinearity profiles
Author
Ozcan, Aydogan ; Digonnet, M.J.F. ; Kino, G.S.
Author_Institution
Edward L. Ginzton Lab., Stanford Univ., CA, USA
Volume
2
fYear
2004
fDate
16-21 May 2004
Abstract
An iterative process known as the Fienup algorithm is applied to correct and improve the accuracy of the second-order optical nonlinearity profile of thin films. This post-processing technique is simple, fast and provides perfect agreement with experimental data.
Keywords
iterative methods; nonlinear optics; optical films; optical information processing; thin films; Fienup algorithm; iterative process; post-processing technique; retrieval accuracy; second-order nonlinearity profiles; thin films;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2004. (CLEO). Conference on
Conference_Location
San Francisco, CA
Print_ISBN
1-55752-777-6
Type
conf
Filename
1360656
Link To Document