DocumentCode
421512
Title
Strain engineered Ge photodetectors on Si platform for broad band optical communications
Author
Liu, Jifeng ; Cannon, Douglas D. ; Wada, Kazumi ; Jongthammanurak, S. ; Danielson, David T. ; Michel, Jurgen ; Kimerling, Lionel C.
Author_Institution
Dept. of Mater. Sci. & Eng., MIT, Cambridge, MA, USA
Volume
2
fYear
2004
fDate
16-21 May 2004
Abstract
This paper presents a strain engineering of Ge photodetectors on Si to cover both C-band and L-band. This high responsivity, Si-CMOS compatible device has promising applications in the next generation of broad band optical communications.
Keywords
CMOS integrated circuits; germanium; integrated optoelectronics; optical communication equipment; photodetectors; silicon; C-band; Ge photodetectors; Ge-Si; L-band; Si platform; Si-CMOS compatible device; broad band optical communications; strain engineered photodetectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2004. (CLEO). Conference on
Conference_Location
San Francisco, CA
Print_ISBN
1-55752-777-6
Type
conf
Filename
1360704
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