Title :
Single shot temporal characterization of sub-hundred femtosecond electron bunches at the SLAC SPPS experiment
Author :
Cavalieri, A. ; Fritz, D.M. ; Lee, S.H. ; Schlarb, H. ; Bucksbaum, Philip H. ; Reis, D.A.
Author_Institution :
SPPS Collaboration, Michigan Univ., Ann Arbor, MI, USA
Abstract :
Electro-optic sampling (EOS) is used to temporally characterize compressed ultra-relativistic electron bunches at the Stanford linear accelerator center (SLAC). These electron bunches are used to produce ultrafast X-rays at the sub-picosecond pulse source experiment (SPPS).
Keywords :
Pockels effect; X-ray lasers; X-ray production; free electron lasers; high-speed optical techniques; particle beam bunching; SLAC SPPS experiment; Stanford linear accelerator center; electrooptic sampling; single shot temporal characterization; subhundred femtosecond electron bunches; subpicosecond pulse source experiment; ultrafast X-rays; ultrarelativistic electron bunches;
Conference_Titel :
Lasers and Electro-Optics, 2004. (CLEO). Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
1-55752-777-6
