Title :
X-Ray Diffraction: New Eyes on the Process
Author :
Anderson, Jon ; De Andrade Gobbo, Luciano ; van Weeren, Harald
Author_Institution :
PANalytical, St. Laurent, QC, Canada
Abstract :
The X-ray diffraction (XRD) analysis of cement process materials has grown beyond its roots in the laboratory to become an important tool for process control. Combined with its partners, i.e., X-ray fluorescence (XRF) and controlled neutron analysis (CNA), these techniques can provide valuable process control information, i.e., essentially “new eyes”, to guide process control decisions. Important developments in XRD analyzers have decreased analysis time from hours to minutes to provide quick results that enable timely process control decisions. XRD phase analysis can provide information to optimize combustion control and mix chemistry, cooler operation, and additive mixtures in finish cement. This paper will provide an overview of all the XRF/XRD applications and then focus on the XRD process control opportunities.
Keywords :
X-ray diffraction; cements (building materials); process control; CNA; X-ray diffraction; X-ray fluorescence; XRD analysis; XRF; cement process materials; controlled neutron analysis; finish cement; process control decision; process control information; Correlation; Fly ash; Process control; Slag; X-ray diffraction; X-ray scattering; Amorphous; Rietveld refinement; X-ray diffraction (XRD); X-ray fluorescence (XRF); cement process control; clinker; neutron analysis; quality assurance; quality control;
Journal_Title :
Industry Applications, IEEE Transactions on
DOI :
10.1109/TIA.2014.2350557