DocumentCode
421810
Title
Thermal profiling of gain saturation in semiconductor optical amplifiers
Author
Luerssen, D. ; Hudgings, Janice ; Ram, Rajeev J. ; Clausen, Edward, Jr. ; Hohl-AbiChedid, Angela
Author_Institution
Dept. of Phys., Mount Holyoke Coll., South Hadley, MA, USA
Volume
1
fYear
2004
fDate
16-21 May 2004
Abstract
Using thermal profiling of semiconductor optical amplifier we measure the location of gain saturation in the device. This method is used to determine the light intensity and gain in the SOA using only surface measurements.
Keywords
integrated optics; integrated optoelectronics; laser variables measurement; optical saturation; semiconductor optical amplifiers; SOA gain; gain saturation; light intensity; photonic integrated circuits; semiconductor optical amplifiers; surface measurements; thermal profiling;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2004. (CLEO). Conference on
Conference_Location
San Francisco, CA
Print_ISBN
1-55752-777-6
Type
conf
Filename
1361258
Link To Document