Title :
Thermal profiling of gain saturation in semiconductor optical amplifiers
Author :
Luerssen, D. ; Hudgings, Janice ; Ram, Rajeev J. ; Clausen, Edward, Jr. ; Hohl-AbiChedid, Angela
Author_Institution :
Dept. of Phys., Mount Holyoke Coll., South Hadley, MA, USA
Abstract :
Using thermal profiling of semiconductor optical amplifier we measure the location of gain saturation in the device. This method is used to determine the light intensity and gain in the SOA using only surface measurements.
Keywords :
integrated optics; integrated optoelectronics; laser variables measurement; optical saturation; semiconductor optical amplifiers; SOA gain; gain saturation; light intensity; photonic integrated circuits; semiconductor optical amplifiers; surface measurements; thermal profiling;
Conference_Titel :
Lasers and Electro-Optics, 2004. (CLEO). Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
1-55752-777-6
