Title :
Dember and photo-emf currents in Si photoconductive detectors
Author :
Dikmelik, Yamaç ; Davidson, Prederic M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Johns Hopkins Univ., Baltimore, MD, USA
Abstract :
Dember and photo-emf currents are investigated in silicon photoconductive detectors both theoretically and experimentally. Dember photocurrents were found to dominate the response of high-purity silicon samples to 852 nm light.
Keywords :
Dember effect; photoconducting devices; photoconducting materials; photoconductivity; photodetectors; semiconductor devices; silicon; 852 nm; Dember photocurrents; Si; Si detectors; high-purity silicon samples; photoconductive detectors; photoelectromotive force; photoemf currents;
Conference_Titel :
Lasers and Electro-Optics, 2004. (CLEO). Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
1-55752-777-6
