Title :
A femtosecond laser-activated silicon reflection switch for electron-beam bunch length measurements
Author :
Asazubi, R. ; Wilke, I. ; Zhong, H. ; Wang, S. ; Zhang, X.-C. ; Fisher, A. ; Bolton, P. ; Carr, R. ; Schlarb, H.
Author_Institution :
Dept. of Phys., Rensselaer Polytech. Inst., Troy, NY, USA
Abstract :
We report an experimental study of the reflection of s- and p-polarized subpicosecond THz-radiation pulses from silicon. We propose silicon reflection switches for electron bunch length measurement via THz wake field diagnostics.
Keywords :
elemental semiconductors; high-speed optical techniques; light polarisation; optical switches; particle beam bunching; silicon; submillimetre wave spectra; THz wake field diagnostics; electron-beam bunch length measurements; femtosecond laser-activated silicon reflection switch; p-polarized subpicosecond THz-radiation pulses; s-polarized subpicosecond THz-radiation pulses;
Conference_Titel :
Lasers and Electro-Optics, 2004. (CLEO). Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
1-55752-777-6
