DocumentCode
422564
Title
Simplified inverse Fourier transform technique to determine second-order optical nonlinearity profiles using a reference sample
Author
Ozcan, A. ; Digonnet, M.J.F. ; Kino, G.S.
Author_Institution
Edward L. Ginzton Lab., Stanford Univ., CA, USA
Volume
2
fYear
2004
fDate
23-27 Feb. 2004
Abstract
A new technique to uniquely determine the nonlinearity profile of nonlinear thin films using a known reference sample is demonstrated. This method is simpler, faster, and experimentally easier to implement than earlier techniques.
Keywords
Fourier transform optics; nonlinear optics; optical films; inverse Fourier transform technique; nonlinear thin films; nonlinearity profile determination; reference sample; second-order optical nonlinearity profile;
fLanguage
English
Publisher
ieee
Conference_Titel
Optical Fiber Communication Conference, 2004. OFC 2004
Conference_Location
Los Angeles, CA, USA
Print_ISBN
1-55752-772-5
Type
conf
Filename
1362186
Link To Document