DocumentCode :
422654
Title :
Nanophotonics for optoelectronic system integration
Author :
Fainman, Y. ; Tetz, K. ; Levy, U. ; Nakagawa, W. ; Tsai, C.-H. ; Chen, C.-H. ; Pang, L. ; Nezhad, M. ; Nesci, A. ; Sun, P.C.
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., San Diego, CA, USA
Volume :
1
fYear :
2004
fDate :
7-11 Nov. 2004
Firstpage :
45
Abstract :
This study explores the unique capabilities and advantages of nanotechnology in developing next generation integrated photonic chips. The described approach includes design, modeling and simulations of example components and devices, their nanofabrication, followed by validation via characterization and testing of the fabricated devices. The latter exploits the recently constructed near field complex amplitude imaging tool. The long-range goal is to develop a range of photonic nanostructures- including artificially birefringent and resonant devices, photonic crystals with defects to tailor spectral filters, metallodielectric composites, and nanostructures for spatial field localization to enhance optical nonlinearities- to facilitate on-chip system integration through compatible materials and fabrication processes.
Keywords :
integrated optics; integrated optoelectronics; micro-optics; nanostructured materials; nanotechnology; photonic crystals; artificially birefringent devices; device characterization; device testing; metallodielectric composites; nanofabrication; nanophotonics; nanotechnology; near field complex amplitude imaging tool; next generation integrated photonic chips; on-chip system integration; optical nonlinearities; optoelectronic system integration; photonic crystals; photonic nanostructures; resonant devices; spatial field localization; spectral filters; Birefringence; Nanofabrication; Nanophotonics; Nanoscale devices; Nanotechnology; Optical filters; Optical imaging; Photonic crystals; Resonance; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Society, 2004. LEOS 2004. The 17th Annual Meeting of the IEEE
Print_ISBN :
0-7803-8557-8
Type :
conf
DOI :
10.1109/LEOS.2004.1363102
Filename :
1363102
Link To Document :
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