DocumentCode
422654
Title
Nanophotonics for optoelectronic system integration
Author
Fainman, Y. ; Tetz, K. ; Levy, U. ; Nakagawa, W. ; Tsai, C.-H. ; Chen, C.-H. ; Pang, L. ; Nezhad, M. ; Nesci, A. ; Sun, P.C.
Author_Institution
Dept. of Electr. & Comput. Eng., California Univ., San Diego, CA, USA
Volume
1
fYear
2004
fDate
7-11 Nov. 2004
Firstpage
45
Abstract
This study explores the unique capabilities and advantages of nanotechnology in developing next generation integrated photonic chips. The described approach includes design, modeling and simulations of example components and devices, their nanofabrication, followed by validation via characterization and testing of the fabricated devices. The latter exploits the recently constructed near field complex amplitude imaging tool. The long-range goal is to develop a range of photonic nanostructures- including artificially birefringent and resonant devices, photonic crystals with defects to tailor spectral filters, metallodielectric composites, and nanostructures for spatial field localization to enhance optical nonlinearities- to facilitate on-chip system integration through compatible materials and fabrication processes.
Keywords
integrated optics; integrated optoelectronics; micro-optics; nanostructured materials; nanotechnology; photonic crystals; artificially birefringent devices; device characterization; device testing; metallodielectric composites; nanofabrication; nanophotonics; nanotechnology; near field complex amplitude imaging tool; next generation integrated photonic chips; on-chip system integration; optical nonlinearities; optoelectronic system integration; photonic crystals; photonic nanostructures; resonant devices; spatial field localization; spectral filters; Birefringence; Nanofabrication; Nanophotonics; Nanoscale devices; Nanotechnology; Optical filters; Optical imaging; Photonic crystals; Resonance; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Society, 2004. LEOS 2004. The 17th Annual Meeting of the IEEE
Print_ISBN
0-7803-8557-8
Type
conf
DOI
10.1109/LEOS.2004.1363102
Filename
1363102
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