DocumentCode :
422889
Title :
An integrated power switching stage with multichip planar interconnection construction
Author :
Liang, Zhenxian ; van Wyk, J.D. ; Lee, Fred C. ; Boroyevich, D.
Author_Institution :
Center for Power Electron. Syst., Virginia Polytech. Inst. & State Univ., Blacksburg, VA
Volume :
1
fYear :
2004
fDate :
14-16 Aug. 2004
Firstpage :
364
Abstract :
A power-switching stage (500 V/12 A), which includes a Si CooIMOS FET/SiC diode power factor correction (PFC) power switching part and a Si MOSFET totem-pole DC/DC power switching part, has been designed and fabricated, based on a planar integration technology, so called embedded power, through building up dielectric/metallization thin-film interconnection directly on coplanar bare power chips embedded in a carrier substrate. This novel construction eliminates completely the first-level interconnection such as wire-bond and solder bump, and is with an integrated three-dimensional (3-D) form factor. Such packaging scheme is superior to reduction of electrical parasitics and to improve the thermal/thermomechanical properties of the module. The procedure adopted for the design and fabrication of this module is presented. The electrical performance including parasitic parameters and switching behavior is characterized experimentally and theoretically with simulation tools such as Maxwell Q3D and I-DEAS. Compared to the conventional wire-bond module, 10% reduction in Rd50Omega (0.2Omega), 75% reduction in parasitic inductance (3.5 nH) and thermal resistance Rthetasjc of 0.115 degC/W have been obtained
Keywords :
DC-DC power convertors; Maxwell equations; dielectric thin films; embedded systems; integrated circuit interconnections; integrated circuit metallisation; multichip modules; power MOSFET; power engineering computing; power semiconductor diodes; semiconductor device metallisation; semiconductor device packaging; silicon compounds; switching convertors; thermal management (packaging); thermal resistance; wide band gap semiconductors; 0.2 ohm; 12 A; 500 V; CooIMOS FET; DC-DC power switching; I-DEAS; Maxwell Q3D; PFC; Si MOSFET; SiC; SiC diode; carrier substrate; coplanar bare power chips; device fabrication; dielectric thin-film interconnection; embedded power; integrated power switching stage; integrated three-dimensional form factor; metallization thin-film interconnection; multichip planar interconnection; packaging scheme; parasitic inductance reduction; parasitic parameters; planar integration technology; power factor correction; simulation tools; solder bump; thermal resistance; thermomechanical properties; wire-bond module;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics and Motion Control Conference, 2004. IPEMC 2004. The 4th International
Conference_Location :
Xi´an
Print_ISBN :
7-5605-1869-9
Type :
conf
Filename :
1377843
Link To Document :
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