Title :
Model selection in top quark tagging with a support vector classifier
Author :
Ridella, Sandro ; Amerio, S. ; Lazzizzera, I.
Abstract :
The problem of tagging a top quark generation event in data coming from the collider detector at Fermilab is considered and tackled through the use of a support vector machine classifier. In order to select a fitting model, a twofold procedure has been adopted. The SVC hyperparameters have been selected through the bootstrap technique and then an additional tuning of the bias value and the error relevance has been performed by means both of a purity vs. efficiency curve and of the AUC value. The generalization capability of the model has been evaluated using the maximal discrepancy criterion.
Keywords :
generalisation (artificial intelligence); learning (artificial intelligence); pattern classification; support vector machines; Collider detector; Fermilab; bias value tuning; bootstrap technique; generalization; maximal discrepancy criterion; support vector machine classifier; top quark generation event; top quark tagging; Cost function; Data engineering; Detectors; Discrete event simulation; Electronic mail; Event detection; Nuclear electronics; Nuclear physics; Static VAr compensators; Tagging;
Conference_Titel :
Neural Networks, 2004. Proceedings. 2004 IEEE International Joint Conference on
Print_ISBN :
0-7803-8359-1
DOI :
10.1109/IJCNN.2004.1380934