The care and feeding of your statistical static timer

Author

Nassif, Sani R. ; Boning, Duane ; Hakim, Nagib

fYear

2004

fDate

7-11 Nov. 2004

Firstpage

138

Lastpage

139

Abstract

The integrated circuit fabrication process has inevitable imperfections and fluctuations that had resulted in ever-growing systematic and random variations in the electrical parameters of active and passive devices fabricated as stated in S. Nassif (2001). The impact of such variations on various aspects of chip performance has been the subject of numerous recent papers, and techniques for analyzing and dealing with such variability roadly labeled design for manufacturability (DFM) - are emerging from research laboratories to practical implementation and deployment, and several service companies are actively engaged in implementing and promoting DFM techniques amongst semiconductor design and manufacturing organizations.

Keywords

design for manufacture; integrated circuit design; statistical process control; active devices; broadly labeled design for manufacturability; chip performance; electrical parameters; integrated circuit fabrication; manufacturing organizations; passive devices; semiconductor design; statistical static timer; Design for manufacture; Fabrication; Fluctuations; Integrated circuit reliability; Integrated circuit technology; Laboratories; Performance analysis; Predictive models; Semiconductor device modeling; Timing;

fLanguage

English

Publisher

ieee

Conference_Titel

Computer Aided Design, 2004. ICCAD-2004. IEEE/ACM International Conference on

ISSN

1092-3152

Print_ISBN

0-7803-8702-3

Type

conf

DOI

10.1109/ICCAD.2004.1382559

Filename

1382559