• DocumentCode
    4244
  • Title

    Linewidth and Noise Characterization for a Partially-Slotted, Single Mode Laser

  • Author

    Bello, F. ; Qiao Yin Lu ; Abdullaev, A. ; Nawrocka, M. ; Donegan, J.F.

  • Author_Institution
    Sch. of Phys., Trinity Coll. Dublin, Dublin, Ireland
  • Volume
    50
  • Issue
    9
  • fYear
    2014
  • fDate
    Sept. 2014
  • Firstpage
    755
  • Lastpage
    759
  • Abstract
    We present an in-depth analysis of the linewidth of a partially slotted semiconductor laser utilized for single mode operation exhibiting integrability with other photonic devices. Theoretically, the reflection coefficients are calculated via the scattering matrix method and implemented within the multimode rate equations for a current-injected quantum well laser while including the effects of noise. The coupling between photon and carrier noise is included for completeness and explicitly derived in this case. The threshold current and linewidth as a function of injection current and cavity length are then calculated for an optimized slot size. Results show state-of-the-art capabilities for this laser to meet industrial requirements for linewidths well under 500 kHz. In addition, experimental data extracted via a heterodyne detection measurement of the electric field spectrum demonstrates similar trends with our theoretical calculations.
  • Keywords
    distributed feedback lasers; heterodyne detection; laser cavity resonators; laser modes; laser noise; quantum well lasers; spectral line breadth; carrier noise; current-injected quantum well laser; electric field spectrum; heterodyne detection; integrability; linewidth characterization; multimode rate equations; noise characterization; partially-slotted single mode laser; photon noise; reflection coefficients; scattering matrix method; Laser modes; Laser noise; Laser theory; Mathematical model; Photonics; Semiconductor lasers; Side-mode suppression ratio (SMSR); noise; single-mode laser; surface grating;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.2014.2344043
  • Filename
    6868236