DocumentCode :
424503
Title :
Input/Output Characteristics of Scalable Parallel Applications
Author :
Crandall, Phyllis E. ; Aydt, Ruth A. ; Chien, Andrew A. ; Reed, Daniel A.
Author_Institution :
University of Illinois at Urbana-Champaign
fYear :
1995
fDate :
1995
Firstpage :
59
Lastpage :
59
Abstract :
Rapid increases in computing and communication performance are exacerbating the long-standing problem of performance-limited input/output. Indeed, for many otherwise scalable parallel applications. input/output is emerging as a major performance bottleneck. The design of scalable input/output systems depends critically on the input/output requirements and access patterns for this emerging class of large-scale parallel applications. However, hard data on the behavior of such applications is only now becoming available. In this paper, we describe the input-output requirements of three scalable parallel applications (electron scattering, terrain rendering, and quantum chemistry, on the Intel Paragon XP/S. As part of an ongoing parallel input/output characterization effort, we used instrumented versions of the application codes to capture and analyze input/output volume, request size distributions, and temporal request structure. Because complete traces of individual application input/output requests were captured, in-depth, off-line analyses were possible. In addition, we conducted informal interviews of the application developers to understand the relation between the codes´ current and desired input/output structure. The results of our studies show a wide variety of temporal and spatial access patterns, including highly read-intensive and write-intensive phases, extremely large and extremely small request sizes, and both sequential and highly irregular access patterns. We conclude with a discussion of the broad spectrum of access patterns and their profound implications for parallel file caching and prefetching schemes.
Keywords :
Application software; Chemistry; Computer science; Concurrent computing; Contracts; Electrical capacitance tomography; Electrons; Environmental economics; Large-scale systems; Particle scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Supercomputing, 1995. Proceedings of the IEEE/ACM SC95 Conference
Print_ISBN :
0-89791-816-9
Type :
conf
DOI :
10.1109/SUPERC.1995.241780
Filename :
1383196
Link To Document :
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