DocumentCode :
424792
Title :
The amplitude phase dynamics and fixed points in tapping-mode atomic force microscopy
Author :
Sebastian, Abu ; Gannepalli, Anil ; Salapaka, Murti V.
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
Volume :
3
fYear :
2004
fDate :
June 30 2004-July 2 2004
Firstpage :
2499
Abstract :
The first harmonic of the cantilever deflection in the tapping-mode operation of an atomic force microscope (AFM) is analyzed using asymptotic methods for weakly nonlinear oscillators. The resulting amplitude and phase dynamical equations are obtained which characterize the transient behavior of tapping-mode dynamics. The steady state behavior is analyzed by examining the fixed points of the amplitude phase dynamics and a simple stability criterion is obtained. Further with a simple tip-sample interaction model, the experimentally observed discontinuous jumps in the amplitude versus tip-sample separation plots are explained and the regions of the interaction regime probed by the tip are investigated.
Keywords :
atomic force microscopy; oscillators; stability; amplitude phase dynamics; cantilever deflection; fixed points; simple stability criterion; simple tip-sample interaction model; steady state behavior; tapping-mode atomic force microscopy; transient behavior; weakly nonlinear oscillators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
American Control Conference, 2004. Proceedings of the 2004
Conference_Location :
Boston, MA, USA
ISSN :
0743-1619
Print_ISBN :
0-7803-8335-4
Type :
conf
Filename :
1383840
Link To Document :
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