• DocumentCode
    42521
  • Title

    BAGC: Buffer-Aware Garbage Collection for Flash-Based Storage Systems

  • Author

    Sungjin Lee ; Dongkun Shin ; Jihong Kim

  • Author_Institution
    Comput. Sci. & Artificial Intell. Lab., Massachusetts Inst. of Technol., Cambridge, MA, USA
  • Volume
    62
  • Issue
    11
  • fYear
    2013
  • fDate
    Nov. 2013
  • Firstpage
    2141
  • Lastpage
    2154
  • Abstract
    NAND flash-based storage device is becoming a viable storage solution for mobile and desktop systems. Because of the erase-before-write nature, flash-based storage devices require garbage collection that causes significant performance degradation, incurring a large number of page migrations and block erasures. To improve I/O performance, therefore, it is important to develop an efficient garbage collection algorithm. In this paper, we propose a novel garbage collection technique, called buffer-aware garbage collection (BAGC), for flash-based storage devices. The BAGC improves the efficiency of two main steps of garbage collection, a block merge step and a victim block selection step, by taking account of the contents of a buffer cache, which is typically used to enhance I/O performance. The buffer-aware block merge (BABM) scheme eliminates unnecessary page migrations by evicting dirty data from a buffer cache during a block merge step. The buffer-aware victim block selection (BAVBS) scheme, on the other hand, selects a victim block so that the benefit of the buffer-aware block merge is maximized. Our experimental results show that BAGC improves I/O performance by up to 43 percent over existing buffer-unaware schemes for various benchmarks.
  • Keywords
    NAND circuits; cache storage; flash memories; BABM scheme; BAGC; BAVBS scheme; I/O performance; NAND flash memory; buffer cache; buffer-aware block merge; buffer-aware garbage collection; buffer-aware victim block selection; erase-before-write nature; flash-based storage systems; garbage collection algorithm; page migrations; Ash; Buffer storage; Educational institutions; Performance evaluation; Registers; Reliability; System-on-a-chip; NAND flash memory; buffer management; flash translation layer (FTL); garbage collection;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.2012.227
  • Filename
    6302127