Mobility Measurement in Nanowires Based on Magnetic Field-Induced Current Splitting Method in H-Shape Devices

This paper investigates a new method to measure mobility in nanowires. With a simple analytical approach and numerical simulations, we bring evidence that the traditional technique of Hall voltage measurement in low-dimensional structures such as nanowires may generate large errors, while being challenging from a technological aspect. Here, we propose to extract the drift mobility in nanowires by measuring a variation of the electric current caused by the presence of a magnetic field, in a specific nanowire network topology. This method overcomes the limitations inherent to the standard Hall effect technique and might open the way to a more precise and simple measurement of mobility in nanowires, still a matter for intensive research.