CMOS IC diagnostics using the luminescence of off-state leakage currents

Author

Polonsky, Stas ; Jenkins, Keith A. ; Weger, Alan ; Cho, Shinho

Author_Institution

IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA

fYear

2004

fDate

26-28 Oct. 2004

Firstpage

134

Lastpage

139

Abstract

The light emission from ever increasing leakage currents in advanced CMOS technologies can now be reliably measured using existing photon detectors. The measurements of this emission provide valuable information about the operation of ICs. We suggest and experimentally demonstrate the following optical techniques: (1) transient logic state detection, (2) transient device temperature measurement, and (3) signal integrity analysis, including crosstalk and power supply noise measurements.

Keywords

CMOS integrated circuits; CMOS logic circuits; integrated circuit testing; leakage currents; logic testing; luminescence; noise measurement; optical variables measurement; CMOS IC diagnostics; crosstalk measurements; light emission; luminescence; off-state leakage currents; optical techniques; photon detectors; power supply noise measurements; signal integrity analysis; transient device temperature measurement; transient logic state detection; CMOS integrated circuits; CMOS technology; Current measurement; Leak detection; Leakage current; Luminescence; Optical devices; Photonic integrated circuits; Stimulated emission; Transient analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2004. Proceedings. ITC 2004. International

Print_ISBN

0-7803-8580-2

Type

conf

DOI

10.1109/TEST.2004.1386945

Filename

1386945