A high-throughput 5 Gbps timing and jitter test module featuring localized processing

A compact timing and jitter test system that leverages custom integrated circuit measurement methods and localized test result processing is presented. It consists of five timing measurement units (TMU) and five timing generation units (TGU) as well as hardware digital processing units for local test result processing or parameter extraction. The TMU channels rely on a component-invariant vernier-delay measurement circuit and the TGU channels rely on linear programmable delay circuitry. The system supports both LVDS and CML highspeed digital interface standards at rates of up to 5 Gbps. This solution occupies 3"×4" of board area, which makes it suitable for placement on the DUT-board. It has a relative delay generation resolution of 3 ps at 5 Gbps, and is capable of autonomous, platform-independent pass-fail testing.