Title :
Verification on port connections
Author :
Lee, Geeng-Wei ; Wang, Chun-Yao ; Huang, Juinn-Dar ; Jou, Jing-Yang
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Abstract :
In a system-on-a-chip (SOC) design, several to hundreds of design blocks or intellectual properties (IPs) are integrated to form a complex function. Prior to verify the functionality of the integrated IPs, it is very important to ensure the correctness of the port connections among these IPs. This work addresses the problem of verification on port connections while IPs are integrated into a larger block or a system, and presents a new connection model and the corresponding error model for port connections. An algorithm providing the minimum pattern set and a general verification flow used to verify port connections are also proposed.
Keywords :
integrated circuit design; integrated circuit interconnections; integrated circuit testing; system-on-chip; SOC design; connection model; error model; integrated IP; intellectual properties; minimum pattern set; port connection verification; system-on-chip design; Circuit faults; Circuit testing; Design engineering; Electronic design automation and methodology; Fault detection; Hardware design languages; Integrated circuit interconnections; Intellectual property; Multichip modules; Process design;
Conference_Titel :
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN :
0-7803-8580-2
DOI :
10.1109/TEST.2004.1387346