Title :
Flat Frequency Response in the Electronic Measurement of Boltzmann´s Constant
Author :
Jifeng Qu ; Yunfeng Fu ; Jianqiang Zhang ; Rogalla, Horst ; Pollarolo, Alessio ; Benz, Samuel P.
Author_Institution :
Nat. Inst. of Metrol., Beijing, China
Abstract :
A new quantum-voltage-calibrated Johnson noise thermometer was developed at the National Institute of Metrology to demonstrate the electrical approach that determines Boltzmann´s constant k, by comparing electrical and thermal noise power. A measurement with an integration period of 19 h and a bandwidth of 638 kHz results in a relative offset of 1 × 10-6, from the current Committee on Data for Science and Technology value of k, and a type A relative standard uncertainty of 17 × 10-6. Closely matched noise powers and transmission-line impedances were achieved, and consequently, the quadratic fitting parameters of the ratio spectrum show flat frequency responses with respect to the measurement bandwidth. This flat response produces a dramatically reduced systematic error compared to that of the National Institute of Standards and Technology measurement of k, in which the relative combined uncertainty was dominated by this error.
Keywords :
calibration; constants; electric noise measurement; frequency response; impedance matching; measurement errors; measurement standards; measurement uncertainty; thermal noise; thermometers; voltage measurement; Boltzmann constant; Committee on Data for Science and Technology; National Institute of Metrology; National Institute of Standards and Technology; bandwidth 638 kHz; electrical noise power; electronic measurement; flat frequency response; measurement uncertainty; quadratic fitting parameter; quantum-voltage-calibrated Johnson noise thermometer; relative standard uncertainty; systematic measurement error; thermal noise power; time 19 h; transmission-line impedance; Bandwidth; Frequency measurement; NIST; Noise; Noise measurement; Resistors; Uncertainty; Correlation; Johnson noise; Josephson voltage standard; noise measurement; temperature measurement;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2013.2238431