• DocumentCode
    4268
  • Title

    A 90–100-GHz Phased-Array Transmit/Receive Silicon RFIC Module With Built-In Self-Test

  • Author

    Inac, Ozgur ; Golcuk, Faith ; Kanar, Tumay ; Rebeiz, Gabriel M.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of California at San Diego, La Jolla, CA, USA
  • Volume
    61
  • Issue
    10
  • fYear
    2013
  • fDate
    Oct. 2013
  • Firstpage
    3774
  • Lastpage
    3782
  • Abstract
    This paper presents the first built-in self-test system (BIST) for W-band transmit-receive phased-array modules. Low-loss high-isolation switches are attached to the RF input and output ports using λ/4 transmission-line sections, which result in a high shunt impedance when the BIST is disabled and minimal penalty in additional loss. A W-band in-phase/quadrature down-conversion mixer/receiver with 0.5-dB amplitude and 4°-5° phase imbalance at 90-100 GHz is also implemented on-chip and is used as an on-chip vector network analyzer. The BIST allows the measurement of the normalized S21 in both transmit and receive modes with high accuracy (4-bit phase response, 0.5-dB amplitude variation) at 90-100 GHz without any external calibration. The BIST also results in a normalized frequency response that agrees well with the measured S-parameters at 90-100 GHz.
  • Keywords
    S-parameters; antenna phased arrays; built-in self test; elemental semiconductors; radiofrequency integrated circuits; silicon; BIST; S-parameters; built-in self-test system; frequency 90 GHz to 100 GHz; in-phase/quadrature downconversion mixer/receiver; on-chip vector network analyzer; phased-array transmit/receive silicon RFIC module; shunt impedance; Built-in self-test; Gain; Insertion loss; Mixers; Noise measurement; Receivers; Semiconductor device measurement; Built-in self-test (BIST); millimeter wave integrated circuits; phase shifters; phased arrays; silicon–germanium (SiGe);
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2013.2280191
  • Filename
    6595147