Title :
Facial expression analysis based on enhanced texture and topographical structure
Author :
Yin, Lijun ; Loi, Johnny ; Xiong, Wei
Author_Institution :
Dept. of Comput. Sci., State Univ. of New York, Binghamton, NY
Abstract :
The variation of facial texture and surface due to the change of expression is an important cue for analyzing and modeling facial expressions. In this paper, we propose a new approach to represent the facial expression by using a so-called topographic feature. In order to capture the variation of facial surface structure, facial textures are processed by increasing the resolution. The topographical structure of human face is analyzed based on the resolution-enhanced textures. We investigate the relationship between the facial expression and its topographic features, and propose to represent the facial expression by the topographic labels. The detected topographic facial surface and the expressive regions reject the status of facial skin movement. Based on the observation that the facial texture and its topographic features change along with facial expressions, we compare the disparity of these features between the neutral face and the expressive face to distinguish a number of universal expressions. The experiment demonstrates the feasibility of the proposed approach for facial expression representation and recognition
Keywords :
face recognition; feature extraction; image enhancement; image resolution; image texture; enhanced texture; facial expression analysis; feature detection; resolution-enhanced textures; topographic feature; topographical structure; Computer interfaces; Computer science; Data mining; Electrical capacitance tomography; Face detection; Face recognition; Humans; Skin; Surface texture; Surface topography;
Conference_Titel :
Systems, Man and Cybernetics, 2004 IEEE International Conference on
Conference_Location :
The Hague
Print_ISBN :
0-7803-8566-7
DOI :
10.1109/ICSMC.2004.1398363