DocumentCode :
42806
Title :
An Analysis on the Optimization of Closed-Loop Detection Method for Optical Voltage Sensor Based on Pockels Effect
Author :
Hui Li ; Liyang Cui ; Zhili Lin ; LiJing Li ; Chunxi Zhang
Author_Institution :
Sch. of Instrum. Sci. & Optoelectron. Eng., Beihang Univ., Beijing, China
Volume :
32
Issue :
5
fYear :
2014
fDate :
1-Mar-14
Firstpage :
1006
Lastpage :
1013
Abstract :
In engineering practice, the closed-loop optical voltage sensor (OVS) based on Pockels effect cannot reach the required precision level mainly due to the various disturbance and noise of system, so the application of OVS for low voltage measurement is restricted. Considering the cross coupling of the main and second closed-loops, the model of disturbance and noise of system that adopts the four-state modulation method is analyzed in the main closed-loop of OVS. Based on the established noise-perturbed stochastic model of OVS, we design a closed-loop detection algorithm for the OVS system to guarantee the mean-square exponential stability with a prescribed H performance in order to optimize the detection precision of OVS. The experimental results show that the detection precision of OVS is 0.144 V while the relative measurement error of the scale factor is within ± 0.15% in measuring low AC voltages from 140 to 500 V, which verifies the effectiveness of the proposed detection scheme.
Keywords :
H optimisation; Pockels effect; optical modulation; optical noise; optical sensors; stochastic processes; voltage measurement; H performance; Pockels effect; closed-loop detection algorithm; cross coupling; four-state modulation method; low voltage measurement; mean-square exponential stability; noise-perturbed stochastic model; optical voltage sensor; optimization analysis; relative measurement error; system disturbance; system noise; voltage 0.144 V; voltage 140 V to 500 V; Cooperative systems; Diversity methods; Fading; Interference; Protocols; Relays; Signal to noise ratio; Optical voltage sensor; closed-loop detection; detection precision;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/JLT.2013.2296518
Filename :
6697876
Link To Document :
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