Title :
Overhead optimization in a MIMO-OFDM testbed based on MMSE MIMO decoding
Author :
Rao, Raghu Mysore ; Lang, Stephan ; Daneshrad, Babak
Author_Institution :
Henry Samueli Sch. of Eng. & Appl. Sci., California Univ., Los Angeles, CA, USA
Abstract :
In this paper, the results of overhead optimization in a MIMO-OFDM testbed based on MMSE MIMO decoding are presented. The testbed used for the wireless field measurements is a configurable, non-realtime, 2×2 multi-antenna testbed operating at 5.25 GHz with a bandwidth of 25 MHz. Modulation and demodulation are performed offline. An adaptive, RLS based MMSE solution is used for MIMO decoding. Continuous pilots are used for carrier frequency offset tracking. The performance of the system for different numbers of training symbols and continuous pilots are analyzed for SISO and MIMO 2×2 configurations in the presence of all analog impairments. The results are first presented in CDFs of slicer SNR and then further analyzed for achievable capacity and throughput. The training and pilot overhead optimization analysis have shown an optimum of 10 training symbols and 5 continuous pilots for this RLS based MIMO 2×2 communication system.
Keywords :
MIMO systems; OFDM modulation; adaptive signal detection; antenna arrays; channel capacity; channel estimation; decoding; least mean squares methods; optimisation; packet switching; radio links; recursive estimation; telecommunication equipment testing; 25 MHz; 5.25 GHz; CDFs; MIMO-OFDM testbed; MMSE MIMO decoding; SISO configurations; achievable capacity; achievable throughput; adaptive RLS based MMSE solution; analog impairments; bandwidth; carrier frequency offset tracking; configurable nonrealtime multi-antenna testbed; continuous pilots; offline demodulation; offline modulation; overhead optimization; packet overhead; pilot overhead; slicer SNR; training overhead; training symbols; wireless field measurements; Bandwidth; Communication systems; Decoding; MIMO; OFDM; Performance analysis; Resonance light scattering; Signal processing algorithms; Testing; Throughput;
Conference_Titel :
Vehicular Technology Conference, 2004. VTC2004-Fall. 2004 IEEE 60th
Print_ISBN :
0-7803-8521-7
DOI :
10.1109/VETECF.2004.1400267