DocumentCode :
428189
Title :
Postdetection switch-and-stay combining in Nakagami-m fading
Author :
Haghani, Sasan ; Beaulieu, Norman C.
Author_Institution :
Dept. of Electr. & Comput. Eng., Alberta Univ., Edmonton, Alta., Canada
Volume :
3
fYear :
2004
fDate :
26-29 Sept. 2004
Firstpage :
1781
Abstract :
In two recent papers (Alouini and Simon (2003), Simon and Alouini (2003)), the performance of dual branch post-detection switch-and-stay combining (SSC) for noncoherent binary orthogonal frequency-shift keying (BFSK) and noncoherent M-ary orthogonal frequency-shift keying (MFSK) operating in the present of slow flat fading modeled by Rayleigh, Nakagami-m, and Rician distributions have been analyzed. This paper shows that the previous analyses of BFSK and MFSK with postdetection SSC in Nakagami-m fading, which was limited to integer values of m, are incorrect and we derive correct bit error rate performance results for BFSK and MFSK with dual-branch SSC in Nakagami-m fading for all values of m. Our analytical results are verified using extensive Monte Carlo simulations. It is shown that for a given bit error rate the performance gain of postdetection SSC over predetection SSC has been overestimated by several dB in SNR in previous reported work.
Keywords :
Monte Carlo methods; error statistics; fading channels; frequency shift keying; BFSK; MFSK; Monte Carlo simulations; Nakagami-m fading; bit error rate performance; dual-branch SSC; noncoherent M-ary orthogonal frequency-shift keying; noncoherent binary orthogonal frequency-shift keying; postdetection SSC; postdetection switch-and-stay combining; Bit error rate; Error analysis; Fading; Frequency shift keying; Mathematical model; Nakagami distribution; Performance analysis; Performance gain; Rayleigh channels; Rician channels;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vehicular Technology Conference, 2004. VTC2004-Fall. 2004 IEEE 60th
ISSN :
1090-3038
Print_ISBN :
0-7803-8521-7
Type :
conf
DOI :
10.1109/VETECF.2004.1400342
Filename :
1400342
Link To Document :
بازگشت