Title :
Exact closed-form expression for the bit error rate of orthogonal STBC in Nakagami fading channels
Author :
Maaref, Amine ; Aïssa, Sonia
Author_Institution :
INRS-EMT, Quebec Univ., Montreal, Que., Canada
Abstract :
We consider the bit error rate (BER) performance of multiple-input multiple-output (MIMO) systems employing transmit diversity through orthogonal space-time block coding (STBC). First, we derive a formula for the characteristic function of the output signal-to-noise ratio (SNR) at the receiver in the presence of Nakagami fading, expressing it in terms of the system diversity order, the code-rate of the employed orthogonal design, and the average SNR per receive antenna. Then, based on a recently proposed general BER expression tor one-and two-dimensional amplitude modulations (PAM and QAM) in AWGN channels (Yoon, D. et al., 2000; Cho, K. and Yoon, 2002), we derive exact closed-form expressions for the BER of Gray-coded PAM and QAM modulations when STBC is employed in the presence of Nakagami fading. We also consider the BER of STBC, when used in conjunction with M-ary phase shift keying (M-PSK), for which we derive a tight closed-form approximation.
Keywords :
AWGN channels; Gray codes; MIMO systems; block codes; diversity reception; error statistics; fading channels; modulation coding; phase shift keying; pulse amplitude modulation; quadrature amplitude modulation; space-time codes; AWGN channels; BER; Gray-coded modulation; M-PSK; M-ary phase shift keying; MIMO systems; Nakagami fading channels; PAM; QAM; SNR; bit error rate; code-rate; exact closed-form expression; multiple-input multiple-output systems; orthogonal STBC; orthogonal space-time block coding; receive antenna; receiver; signal-to-noise ratio; system diversity order; tight closed-form approximation; transmit diversity; Amplitude modulation; Bit error rate; Block codes; Closed-form solution; Fading; MIMO; Quadrature amplitude modulation; Receiving antennas; Signal design; Signal to noise ratio;
Conference_Titel :
Vehicular Technology Conference, 2004. VTC2004-Fall. 2004 IEEE 60th
Print_ISBN :
0-7803-8521-7
DOI :
10.1109/VETECF.2004.1400502