DocumentCode
429121
Title
An investigation of EEG artifacts elimination using a neural network with non-recursive 2nd order volterra filters
Author
Shigemura, Shusaku ; Nishimura, Toshihiro ; Tsubai, Masayoshi ; Yokoi, Hirokazu
Author_Institution
Graduate Sch. of Information, Production & Syst., Waseda Univ., Fukuoka, Japan
Volume
1
fYear
2004
fDate
1-5 Sept. 2004
Firstpage
612
Lastpage
615
Abstract
The artifacts caused by various factors, EOG (electrooculogram), blink and EMG (electromyogram), in EEG (electroencephalogram) signals increase the difficulty in analyzing them. In addition, EEG signals containing artifacts often cannot be used in analyzing them. So, it is useful and indispensable to eliminate the artifacts from EEG signals. A neural network with non-recursive 2nd order volterra filters is used to eliminate the artifacts from EEG signals. The proposed method is a new approach in respect to slotting a non-recursive 2nd order volterra filter into individual neurons of a neural network. First of all, in order to investigate the usefulness of the proposed method in eliminating the artifacts from EEG signals, we apply it to the artificial EEG signals mat are weakly stationary process. As the result, the artifacts can be eliminated from EEG signals almost exactly using the proposed method, and ft is suggested the proposed method should be useful in eliminating the artifacts from EEG signals.
Keywords
electroencephalography; filters; medical signal processing; neural nets; neurophysiology; EEG artifacts elimination; blink; electroencephalogram; electromyogram; electrooculogram; neural network; neurons; nonrecursive 2nd order volterra filters; Artificial neural networks; Biological neural networks; Educational institutions; Electroencephalography; Humans; Neurons; Nonlinear filters; Production systems; Signal analysis; Signal processing; Artifacts; Blink; EEG; Neural Network; Non-recursive 2nd order Volterra Filter;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2004. IEMBS '04. 26th Annual International Conference of the IEEE
Conference_Location
San Francisco, CA
Print_ISBN
0-7803-8439-3
Type
conf
DOI
10.1109/IEMBS.2004.1403232
Filename
1403232
Link To Document