DocumentCode
429235
Title
New texture shape feature coding-based computer aided diagnostic methods for classification of masses on mammograms
Author
Chen, Yuan ; Chang, Chein-I
Author_Institution
Dept. of Comput. Sci. & Electr. Eng., Maryland Univ., Baltimore, MD, USA
Volume
1
fYear
2004
fDate
1-5 Sept. 2004
Firstpage
1275
Lastpage
1278
Abstract
This work presents new texture shape feature coding (TSFC)-based computer aided diagnostic (CAD) classification methods for classification of masses on mammograms. It introduces a new concept of 1.5-order 3-neighbor 3×3 connectivity to extract texture shape features that can describe multiples of 22.5°. In order to effectively utilize these shape features, two new methods of implementing TFSC are further proposed to convert these features to texture feature numbers (TFNs), TFNs in quaternary (TFNq) which expresses a TFN in quaternary expansion and TFNs in product (TFNx ) that represents a TFN in terms of a product. Both TFNq and TFNx can then produce texture shape histograms in the same way that a gray-level histogram is generated for an image. Such a texture shape histogram is further used to generate various shape features of masses on mammograms for classification. In order to demonstrate the promise of our TSFC-based CAD methods, the MiniMammographic database provided by the Mammographic Image Analysis Society (MIAS) is used for experiments.
Keywords
cancer; feature extraction; image classification; image coding; image texture; mammography; medical image processing; tumours; Mammographic Image Analysis Society; MiniMammographic database; computer aided diagnostic method; gray-level histogram; mammogram; mass classification; quaternary expansion; texture feature numbers; texture shape feature coding; Character recognition; Computer science; Feature extraction; Histograms; Image coding; Image processing; Laboratories; Remote sensing; Shape; Signal processing;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2004. IEMBS '04. 26th Annual International Conference of the IEEE
Conference_Location
San Francisco, CA
Print_ISBN
0-7803-8439-3
Type
conf
DOI
10.1109/IEMBS.2004.1403403
Filename
1403403
Link To Document